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esp32-s2_dfu
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Code Issues Releases Activity

add test for EHCI register offset 

add test for EHCI usbcmd register structure
This commit is contained in:
hathach 2013-02-27 17:14:59 +07:00
parent b73e6c7a35
commit 8869d17d98
1 changed files with 40 additions and 3 deletions
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43
tests/test/host/ehci/test_ehci.c
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@ -51,9 +51,9 @@ uint8_t number_of_high_bits(uint32_t value);
({\
uint32_t value=0;\
struct_type str;\
memclr_(&str, sizeof(struct_type));\
memclr_((void*)&str, sizeof(struct_type));\
str.member.bitfield_member = 1;\
memcpy(&value, &str.member, sizeof(str.member));\
memcpy(&value, (void*)&str.member, sizeof(str.member));\
first_pos_of_high_bit( value );\
})
@ -73,7 +73,9 @@ void tearDown(void)
{
}
//--------------------------------------------------------------------+
//
//--------------------------------------------------------------------+
void test_struct_alignment(void)
{
TEST_ASSERT_EQUAL( 32, __alignof__(ehci_qhd_t) );
@ -95,6 +97,9 @@ void test_struct_size(void)
TEST_ASSERT_EQUAL( 4, sizeof(ehci_link_t) );
}
//--------------------------------------------------------------------+
// EHCI Data Structure
//--------------------------------------------------------------------+
void test_qtd_structure(void)
{
TEST_ASSERT_EQUAL( 0, offsetof(ehci_qtd_t, next));
@ -197,6 +202,38 @@ void test_sitd_structure(void)
TEST_ASSERT_EQUAL( 4*6, offsetof(ehci_sitd_t, back));
}
//--------------------------------------------------------------------+
// EHCI Register Interface
//--------------------------------------------------------------------+
void test_register_offset(void)
{
TEST_ASSERT_EQUAL( 0x00, offsetof(ehci_registers_t, usb_cmd));
TEST_ASSERT_EQUAL( 0x04, offsetof(ehci_registers_t, usb_sts));
TEST_ASSERT_EQUAL( 0x08, offsetof(ehci_registers_t, usb_int_enable));
TEST_ASSERT_EQUAL( 0x0C, offsetof(ehci_registers_t, frame_index));
TEST_ASSERT_EQUAL( 0x10, offsetof(ehci_registers_t, ctrl_ds_seg));
TEST_ASSERT_EQUAL( 0x14, offsetof(ehci_registers_t, periodic_list_base));
TEST_ASSERT_EQUAL( 0x18, offsetof(ehci_registers_t, async_list_base));
TEST_ASSERT_EQUAL( 0x1C, offsetof(ehci_registers_t, tt_control)); // NXP specific
TEST_ASSERT_EQUAL( 0x40, offsetof(ehci_registers_t, config_flag)); // NXP not used
TEST_ASSERT_EQUAL( 0x44, offsetof(ehci_registers_t, portsc));
}
void test_register_usbcmd(void)
{
TEST_ASSERT_EQUAL( 0 , BITFIELD_OFFSET_OF_MEMBER(ehci_registers_t, usb_cmd_bit, run_stop) );
TEST_ASSERT_EQUAL( 1 , BITFIELD_OFFSET_OF_MEMBER(ehci_registers_t, usb_cmd_bit, reset) );
TEST_ASSERT_EQUAL( 2 , BITFIELD_OFFSET_OF_MEMBER(ehci_registers_t, usb_cmd_bit, framelist_size) );
TEST_ASSERT_EQUAL( 4 , BITFIELD_OFFSET_OF_MEMBER(ehci_registers_t, usb_cmd_bit, periodic_enable) );
TEST_ASSERT_EQUAL( 5 , BITFIELD_OFFSET_OF_MEMBER(ehci_registers_t, usb_cmd_bit, async_enable) );
TEST_ASSERT_EQUAL( 6 , BITFIELD_OFFSET_OF_MEMBER(ehci_registers_t, usb_cmd_bit, int_advacne_async) );
TEST_ASSERT_EQUAL( 7 , BITFIELD_OFFSET_OF_MEMBER(ehci_registers_t, usb_cmd_bit, light_reset) );
TEST_ASSERT_EQUAL( 8 , BITFIELD_OFFSET_OF_MEMBER(ehci_registers_t, usb_cmd_bit, async_park) );
TEST_ASSERT_EQUAL( 11 , BITFIELD_OFFSET_OF_MEMBER(ehci_registers_t, usb_cmd_bit, async_park_enable) );
TEST_ASSERT_EQUAL( 15 , BITFIELD_OFFSET_OF_MEMBER(ehci_registers_t, usb_cmd_bit, nxp_framelist_size_msb) );
TEST_ASSERT_EQUAL( 16 , BITFIELD_OFFSET_OF_MEMBER(ehci_registers_t, usb_cmd_bit, int_threshold) );
}
//--------------------------------------------------------------------+
// Helper
//--------------------------------------------------------------------+